BS EN IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures
EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
EN 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
EN 60368-1:2000 Piezoelectric filters of assessed quality Part 1: Generic specification (Incorporates Amendment A1: 2004)
EN 60368-2-2:1999 Piezoelectric Filters - Part 2: Guide to the Use of Piezoelectric Filters - Section 2: Piezoelectric Ceramic Filters
EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections*， 2023-12-23 Update
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
EN 61019-2:2005 Surface acoustic wave (SAW) resonators Part 2: Guide to the use
EN 61240:2012 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules*， 2023-12-23 Update
EN ISO 1101:2017 Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form@ orientation@ location and run-out
IEC 60122-2:1983 Quartz crystal units for frequency control and selection. Part 2 : Guide to the use of quartz crystal units for frequency control and selection
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60368-1:2000 Piezoelectric filters of assessed quality - Part 1: Generic specification
IEC 60368-2-2:1996 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guide for the use
IEC 61 Lamp caps and holders together with gauges for the control of interchangeability and safety; part 4: guidelines and general information; supplement 1 to IEC 61-4(1990)
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
ISO 1101:2017 Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out
BS EN IEC 61837-2:2018 history
2020BS EN IEC 61837-2:2018+A1:2020 Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections - Ceramic enclosures
2018BS EN IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures