IEC 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

Standard No.

IEC 60679-1:2017

Release Date

2017

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60679-1:2017

Replace

IEC 49/1229/FDIS:2017 IEC 60679-1:2007

Scope

This part of IEC 60679 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.

IEC 60679-1:2017 Referenced Document

• IEC 60027-1:1992 Letter symbols to be used in electrical technology; part 1: general
• IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
• IEC 60027-3:2002 Letter symbols to be used in electrical technology - Part 3: Logarithmic and related quantities, and their units
• IEC 60027-4:2006 Letter symbols to be used in electrical technology - Part 4: Rotating electric machines
• IEC 60027-6:2006 Letter symbols to be used in electrical technology - Part 6: Control technology
• IEC 60027-7:2010 Letter symbols to be used in electrical technology - Part 7: Power generation, transmission and distribution
• IEC 60050-561:2014 International electrotechnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• IEC 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
• IEC 60617-DB:2001 Graphical symbols for diagrams
• IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
• IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
• IEC 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
• IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
• ISO 80000-1:2009 Quantities and units - Part 1: General

IEC 60679-1:2017 history

• 2017 IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
• 2007 IEC 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• 1970 IEC 60679-1:1997/AMD2:2003 Amendment 2 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• 1970 IEC 60679-1:1997/AMD1:2002 Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• 1997 IEC 60679-1:1997 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• 1970 IEC 60679-1:1980/AMD1:1985 Amendment 1 - Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods
• 1980 IEC 60679-1:1980 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods