GB/T 31958-2015
Substrate glass for thin film transistor liquid crystal display device (English Version)
- Standard No.
- GB/T 31958-2015
- Language
- Chinese, Available in English version
- Release Date
- 2015
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2024-03
- Replace By
- GB/T 31958-2023
- Latest
- GB/T 31958-2023
- Scope
- This standard specifies the terms and definitions, requirements, test methods, inspection rules, packaging, marking, transportation and storage of substrate glass for thin film transistor liquid crystal displays. This standard applies to substrate glass for thin film transistor liquid crystal displays.
GB/T 31958-2015 Referenced Document
- GB/T 16920-1997 Glass--Determination of coefficient of mean linear thermal expansion
- GB/T 2828.1-2012 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)
- GB/T 5432-2008 Test method for density of glass by buoyancy
- GB/T 5433-2008 Test method for the transmittance of domestic glass
- SJ/T 10909 Determination of K2O, Na2O and Li2O in electronic glass - Flame spectroscopy method
- SJ/T 11039 Test method for annealing point and strain point of electronic glass
GB/T 31958-2015 history
- 2023 GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display
- 2015 GB/T 31958-2015 Substrate glass for thin film transistor liquid crystal display device
