BS ISO 16700:2016
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- Standard No.
- BS ISO 16700:2016
- Release Date
- 2016
- Published By
- British Standards Institution (BSI)
- Latest
- BS ISO 16700:2016
- Replace
- BS ISO 16700:2004
BS ISO 16700:2016 Referenced Document
- ISO 5725-1 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions*， 2023-07-01 Update
- ISO Guide 30 Reference materials - Selected terms and definitions
- ISO Guide 34 General requirements for the competence of reference material producers
- ISO Guide 35 Certification of reference materials — General and statistical principles*， 2017-08-21 Update
- ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
- ISO/IEC Guide 98-3 Uncertainty of measurement - Guide to the expression of uncertainty in measurement (GUM:1995). Extension to any number of output quantities
BS ISO 16700:2016 history
- 2016 BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 2004 BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
