General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest
GB/T 31353-2014
Scope
This standard specifies the test method for the curvature of sapphire cutting discs, grinding discs and polishing discs (hereinafter referred to as sapphire substrate discs). This standard is applicable to the test of the curvature of sapphire substrates with a diameter of 50.8 mm to 304.8 mm and a thickness of not less than 200 μm.
GB/T 31353-2014 Referenced Document
GB/T 14264 Semiconductor materials-Terms and definitions
GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)