KS L 1620-2013
Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method

Standard No.

KS L 1620-2013

Release Date

2013

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Replace By

KS L 1620-2013(2018)

Latest

KS L 1620-2023

Replace

KS L 1620-2003

Scope

This standard specifies a method for testing the resistivity of conductive ceramic thin films by the Van der Pauw method. The range of applicable resistivity is 1×10-5 Ωcm to 1×102 Ωcm.

KS L 1620-2013 history

• 2023 KS L 1620-2023 Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method
• 0000 KS L 1620-2013(2018)
• 2013 KS L 1620-2013 Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method
• 2003 KS L 1620-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method