KS L 1620-2003
Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method

Standard No.

KS L 1620-2003

Release Date

2003

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced 2013-10

Replace By

KS L 1620-2013

Latest

KS L 1620-2023

Scope

This standard measures the resistivity of conductive ceramic thin films using the Van der Pauw method.

KS L 1620-2003 history

• 2023 KS L 1620-2023 Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method
• 0000 KS L 1620-2013(2018)
• 2013 KS L 1620-2013 Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method
• 2003 KS L 1620-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with Van der Pauw method