BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- Standard No.
- BS ISO 13095:2014
- Release Date
- 2014
- Published By
- British Standards Institution (BSI)
- Latest
- BS ISO 13095:2014
BS ISO 13095:2014 Referenced Document
- ISO 11039 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
- ISO 11952 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems*， 2019-05-21 Update
- ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
- ISO/TS 80004-4:2011 Nanotechnologies - Vocabulary - Part 4: Nanostructured materials
BS ISO 13095:2014 history
- 2014 BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
