JIS R 1683:2014
Test method for surface roughness of ceramic thin films by atomic force microscopy

Standard No.

JIS R 1683:2014

Release Date

2014

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS R 1683:2014

Replace

JIS R 1683:2007

JIS R 1683:2014 Referenced Document

• JIS B 0601 Geometrical Product Specifications (GPS).Surface texture: Profile method.Terms, definitions and surface texture parameters
• JIS B 0633 Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Rules and procedures for the assessment of surface texture
• JIS B 0651 Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Nominal characteristics of contact (stylus) instruments
• JIS Z 8401 Guide to the rounding of numbers

JIS R 1683:2014 history

• 2014 JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
• 2007 JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy