KS L 1619-2003
Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method

Standard No.

KS L 1619-2003

Release Date

2003

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced 2013-10

Replace By

KS L 1619-2013

Latest

KS L 1619-2023

Scope

This standard defines a method for testing the resistivity of conductive ceramic thin films by the four-probe method.

KS L 1619-2003 history

• 2023 KS L 1619-2023 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
• 0000 KS L 1619-2013(2018)
• 2013 KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
• 2003 KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method