KS C IEC 60749-10:2004
Semiconductor devices－Mechanical and climatic test methods－Part 10：Mechanical shock

Standard No.

KS C IEC 60749-10:2004

Release Date

2004

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-10:2020

Latest

KS C IEC 60749-10:2020

Scope

Impact testing refers to the sudden action or action of force resulting from rough handling, transportation or processing.

KS C IEC 60749-10:2004 history

• 2020 KS C IEC 60749-10:2020 Semiconductor devices — Mechanical and climatic test methods — Part 10: Mechanical shock
• 2004 KS C IEC 60749-10:2004 Semiconductor devices－Mechanical and climatic test methods－Part 10：Mechanical shock