KS C IEC 60749-10:2020
Semiconductor devices — Mechanical and climatic test methods — Part 10: Mechanical shock
Home
KS C IEC 60749-10:2020
Standard No.
KS C IEC 60749-10:2020
Release Date
2020
Published By
Korean Agency for Technology and Standards (KATS)
Latest
KS C IEC 60749-10:2020
KS C IEC 60749-10:2020 history
2020
KS C IEC 60749-10:2020
Semiconductor devices — Mechanical and climatic test methods — Part 10: Mechanical shock
2004
KS C IEC 60749-10:2004
Semiconductor devices-Mechanical and climatic test methods-Part 10:Mechanical shock
Copyright ©2023 All Rights Reserved