KS C IEC 60749-2:2004
Semiconductor devices－Mechanical and climatic test methods－Part 2：Low air pressure

Standard No.

KS C IEC 60749-2:2004

Release Date

2004

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-2:2020

Latest

KS C IEC 60749-2:2020

Scope

This standard covers low atmospheric pressure testing of semiconductor devices. The test is performed in standby and hold during decompression.

KS C IEC 60749-2:2004 history

• 2020 KS C IEC 60749-2:2020 Semiconductor devices — Mechanical and climatic test methods — Part 2: Low air pressure
• 2004 KS C IEC 60749-2:2004 Semiconductor devices－Mechanical and climatic test methods－Part 2：Low air pressure