KS C IEC 60749-2:2020
Semiconductor devices — Mechanical and climatic test methods — Part 2: Low air pressure

Standard No.

KS C IEC 60749-2:2020

Release Date

2020

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS C IEC 60749-2:2020

KS C IEC 60749-2:2020 history

• 2020 KS C IEC 60749-2:2020 Semiconductor devices — Mechanical and climatic test methods — Part 2: Low air pressure
• 2004 KS C IEC 60749-2:2004 Semiconductor devices－Mechanical and climatic test methods－Part 2：Low air pressure