GB/T 5594.3-1985
Test methods for properties of structure ceramic used in electronic components--Test method for mean coefficient of linear expansion (English Version)
- Standard No.
- GB/T 5594.3-1985
- Language
- Chinese, Available in English version
- Release Date
- 1985
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2016-01
- Replace By
- GB/T 5594.3-2015
- Latest
- GB/T 5594.3-2015
- Scope
- This standard is suitable for measuring the average linear expansion coefficient of structural ceramics for electronic components in various stages from room temperature to 800 °C.
GB/T 5594.3-1985 history
- 2015 GB/T 5594.3-2015 Test methods for properties of structure ceramic used in electronic components and device.Part 3:Test method for mean coefficient of linear expansion
- 1985 GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components--Test method for mean coefficient of linear expansion
GB/T 5594.3-1985 -All Parts
GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components--Test method for gas-tightness
GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components--Test method for Young's elastic modulus and Poisson ratio
GB/T 5594.3-2015 Test methods for properties of structure ceramic used in electronic components and device.Part 3:Test method for mean coefficient of linear expansion
GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device.Part 4:Test method for permittivity and dielectric loss angle tangent value
GB/T 5594.5-1985 Test methods for properties of structure ceramic used in electronic components--Test method for volume resistivity
GB/T 5594.6-2015 Test methods for properties of structure ceramics used in electronic component and device.Part 6:Test method for chemical durability
GB/T 5594.7-2015 Test methods for properties of structure ceramic used in electronic components and device.Part 7:Test method for liquid permeability
GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device.Part 8:Test method for microstructure