DS/EN 60749-32/A1:2010
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Standard No.

DS/EN 60749-32/A1:2010

Release Date

2010

Published By

Danish Standards Foundation

Latest

DS/EN 60749-32/A1:2010

Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.

DS/EN 60749-32/A1:2010 history

• 2010 DS/EN 60749-32/A1:2010 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
• 2004 DS/EN 60749-32+Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)