GB/T 2689.4-1981
Life test and acceleration life test--Optimal linear deflection-free evaluation of Weibull distributions (English Version)

Standard No.: GB/T 2689.4-1981
Language: Chinese, Available in English version
Release Date: 1981
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 2689.4-1981

Scope: This International Standard specifies procedures and methods for the best linear unbiased estimation method for constant stress life testing and accelerated life testing. It is suitable for the life of electronic component products (hereinafter referred to as products) obeys the Weibull distribution, the shape parameter m>0, the characteristic life η>0, the position parameter γ=0, and the number of test samples in each group is n≤25. Data processing for tail life tests and accelerated life tests.

GB/T 2689.4-1981 history

1981 GB/T 2689.4-1981 Life test and acceleration life test--Optimal linear deflection-free evaluation of Weibull distributions