IEC 60749-30:2011
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Standard No.

IEC 60749-30:2011

Release Date

2011

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2011-08

Replace By

IEC 60749-30:2005/AMD1:2011

Latest

IEC 60749-30:2020 RLV

IEC 60749-30:2011 history

• 0000 IEC 60749-30:2020 RLV
• 2011 IEC 60749-30:2005/AMD1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
• 2011 IEC 60749-30:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
• 2005 IEC 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing