IEC 60749-7:2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- Standard No.
- IEC 60749-7:2002
- Release Date
- 2002
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 60749-7:2002/COR1:2003
- Latest
- IEC 60749-7:2011
- Scope
- The purpose of this part of IEC 60749 is to test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. It can be destructive (Methods 1 and 2) or non-destructive (Method 3).
IEC 60749-7:2002 history
- 2011 IEC 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- 1970 IEC 60749-7:2002/COR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- 2002 IEC 60749-7:2002 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
