JIS K 0167:2011
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Standard No.

JIS K 0167:2011

Release Date

2011

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS K 0167:2011

JIS K 0167:2011 Referenced Document

• ISO 21270 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
• JIS K 0147 Surface chemical analysis -- Vocabulary

JIS K 0167:2011 history

• 2011 JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials