ISO 21270:2004
Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

Standard No.

ISO 21270:2004

Release Date

2004

Published By

International Organization for Standardization (ISO)

Latest

ISO 21270:2004

Scope

This standard specifies two methods for determining the maximum count rate of AES and XPS spectrometer intensity scales within the allowable linear dispersion limits. It also includes methods for correcting for intensity nonlinearity so that higher maximum count rates can be used for those spectrometers for which the associated correction formulas have proven to be effective.

ISO 21270:2004 Referenced Document

• ISO 18115 Surface chemical analysis - Vocabulary; Amndment 2*， 2007-12-01 Update

ISO 21270:2004 history

• 2004 ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale