BS EN 15991:2011
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Standard No.

BS EN 15991:2011

Release Date

2011

Published By

British Standards Institution (BSI)

Status

Be replaced 2015-11

Replace By

BS EN 15991:2015

Latest

BS EN 15991:2015

BS EN 15991:2011 history

• 2015 BS EN 15991:2015 Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
• 2011 BS EN 15991:2011 Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)