DB31/T 297-2003
Calibration method of magnification of scanning electron microscope (English Version)

Standard No.

DB31/T 297-2003

Language

Chinese, Available in English version

Release Date

2004

Published By

Shanghai Provincial Standard of the People's Republic of China

Latest

DB31/T 297-2003

DB31/T 297-2003 Referenced Document

• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ISO Guide 30:1992 Terms and definitions used in connection with reference materials
• JB/T 6842-1993 Test method of scanning electron microscope
• JJG 550-1988 Verification Regulation of Scanning Electron Microscope

DB31/T 297-2003 history

• 2004 DB31/T 297-2003 Calibration method of magnification of scanning electron microscope