JB/T 6842-1993
Test method of scanning electron microscope (English Version)
- Standard No.
- JB/T 6842-1993
- Language
- Chinese, Available in English version
- Release Date
- 1993
- Published By
- Professional Standard - Machinery
- Status
- Latest
- JB/T 6842-1993
- Scope
- This standard specifies test methods for scanning electron microscopy. This standard is suitable for testing the performance of the scanning electron microscope host.
JB/T 6842-1993 history
- 1993 JB/T 6842-1993 Test method of scanning electron microscope
