IEC 60749-24:2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (Edition 1.0; Replaces IEC PAS 62336:2002)
- Standard No.
- IEC 60749-24:2004
- Release Date
- 2004
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 60749-24:2005
- Latest
- IEC 60749-24:2005
IEC 60749-24:2004 history
- 2005 IEC 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
- 2004 IEC 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (Edition 1.0; Replaces IEC PAS 62336:2002)
