EN 60749-5:2003
Semiconductor devices Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test

Standard No.

EN 60749-5:2003

Release Date

2003

Published By

European Committee for Electrotechnical Standardization（CENELEC）

Status

Be replaced

Replace By

EN 60749-5:2017

Latest

EN 60749-5:2017

EN 60749-5:2003 history

• 2017 EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
• 2003 EN 60749-5:2003 Semiconductor devices Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test