European Committee for Electrotechnical Standardization（CENELEC）
Latest
EN 60749-5:2017
Replace By
prEN IEC 60749-5:2022
Scope
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.
EN 60749-5:2017 history
2017EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
2003EN 60749-5:2003 Semiconductor devices Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test