GB/T 14849.4-2008
Methods for chemical analysis of silicon metal.Part 4: Determination of elements content.Inductively coupled plasma atomic emission specrometric method (English Version)
- Standard No.
- GB/T 14849.4-2008
- Language
- Chinese, Available in English version
- Release Date
- 2008
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2015-08
- Replace By
- GB/T 14849.4-2014
- Latest
- GB/T 14849.4-2014
- Scope
- This part specifies the determination method of iron, aluminum, calcium, titanium manganese and nickel content in industrial silicon. This part is applicable to the determination of iron, aluminum, calcium, titanium manganese and nickel content in industrial silicon. The determination range is shown in Table 1.
GB/T 14849.4-2008 history
- 2014 GB/T 14849.4-2014 Methods for chemical analysis of silicon metal.Part 4:Determination of impurity contents.Inductively coupled plasma atomic emission spectrometric method
- 2008 GB/T 14849.4-2008 Methods for chemical analysis of silicon metal.Part 4: Determination of elements content.Inductively coupled plasma atomic emission specrometric method
GB/T 14849.4-2008 -All Parts
GB/T 14849.1-2020 Methods for chemical analysis of silicon metal—Part 1：Determination of iron content
GB/T 14849.10-2016 Methods for chemical analysis of industrial silicon - Part 10: Determination of mercury content by atomic fluorescence spectrometry
GB/T 14849.11-2016 Methods for chemical analysis of industrial silicon - Part 11: Determination of chromium content - Diphenylcarbazide spectrophotometric method
GB/T 14849.2-2007 Methods for chemical analysis of silicon metal Part 2:Determination of aluminum content Chrome azurol S spectrophotometric method
GB/T 14849.3-2020 Methods for chemical analysis of silicon metal—Part 3：Determination of calcium content
GB/T 14849.4-2014 Methods for chemical analysis of silicon metal.Part 4:Determination of impurity contents.Inductively coupled plasma atomic emission spectrometric method
GB/T 14849.5-2014 Methods for chemical analysis of silicon metal.Part 5:Determination of impurity contents.X-ray fluorescence method
GB/T 14849.6-2014 Methods for chemical analysis of silicon metal.Part 6:Determination of carbon.Infrared absorption method
GB/T 14849.7-2015 Methods for chemical analysis of silicon metal.Part 7:Detemination of phosphorus content.Phosphorus molybdenum blue spectrophotometry
GB/T 14849.8-2015 Methods for chemical analysis of silicon metal.Part 8:Determination of copper content.Atomic absorption spectrometric method
GB/T 14849.9-2015 Methods for chemical analysis of silicon metal.Part 9:Determination of titanium content.Diantipyryl methane spectrophotometry