ASTM F1893-98
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

Standard No.

ASTM F1893-98

Release Date

1998

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM F1893-98(2003)

Latest

ASTM F1893-18

Scope

1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

ASTM F1893-98 history

• 2018 ASTM F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
• 2011 ASTM F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
• 1998 ASTM F1893-98(2003) Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
• 1998 ASTM F1893-98 Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices