This is Technical Corrigendum 1 to IEC 60749-11-2002 (Semiconductor devices -Mechanical and climatic test methods -Part 11:Rapid change of temperature -Two-fluid-bath method)
IEC 60749-11:2002/COR1:2003 history
2003IEC 60749-11:2002/COR2:2003 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method; Corrigendum 2
2003IEC 60749-11:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method
2002IEC 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method