IEC 60749-8:2002/COR1:2003
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
- Standard No.
- IEC 60749-8:2002/COR1:2003
- Release Date
- 2003
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 60749-8:2002/COR2:2003
- Latest
- IEC 60749-8:2002/COR2:2003
- Scope
- This is Technical Corrigendum 1 to IEC 60749-8-2002 (Semiconductor devices -Mechanical and climatic test methods -Part 8: Sealing)
IEC 60749-8:2002/COR1:2003 history
- 2003 IEC 60749-8:2002/COR2:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
- 2003 IEC 60749-8:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
- 2002 IEC 60749-8:2002 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
