IEC 60749-6:2002/COR1:2003
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Standard No.

IEC 60749-6:2002/COR1:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2017-03

Replace By

IEC 60749-6:2017

Latest

IEC 60749-6:2017

Scope

This is Technical Corrigendum 1 to IEC 60749-6-2002 (Semiconductor devices -Mechanical and climatic test methods -Part 6:Storage at high temperature)

IEC 60749-6:2002/COR1:2003 history

• 2017 IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
• 2003 IEC 60749-6:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
• 2002 IEC 60749-6:2002 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature