CSN 35 8757 Cast.5-1985
Transistors. Method of measuring collector and emitter barrier layer capacltance

Standard No.
CSN 35 8757 Cast.5-1985
Release Date
1985
Published By
CZ-CSN
Status
Latest
CSN 35 8757 Cast.5-1985

CSN 35 8757 Cast.5-1985 history

CSN 35 8757 Cast.5-1985 -All Parts

CSN 35 8757 Cast.1-1985 Transistors. Measuring method of collector-base and emitterbase breakdown voltage CSN 35 8757 Cast.10-1986 Transistors. Methods for measurement of output capaclty In common base connection CSN 35 8757 Cast.11-1986 Transistors. Method for measurement of switching times CSN 35 8757 Cast.12-1989 Blpolar transistors. Impuls measuring method of break-down voltage collector-emltter CSN 35 8757 Cast.2-1985 Transistors. Measuring method of common-emitter small-signal short-circuit forward current transfer ratio CSN 35 8757 Cast.3-1984 Transistore. Method of noise figu?e measuring CSN 35 8757 Cast.4-1985 Transistors. Methods of measuring collector cut-off current, emitter cut-off current and collector-emitter cut-off current CSN 35 8757 Cast.6-1985 Measuring method of static value of the common-emitter forward ourrent transfer ratio CSN 35 8757 Cast.7-1985 Transistors. Measuring method of absolute value of forward current transfer ratio and transition frequency CSN 35 8757 Cast.8-1985 Transistors. Measuring methods of base-emitor voltage CSN 35 8757 Cast.9-1986 Transistors. Methods for measurement of thermal resistance


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