CSN 35 8757 Cast.1-1985
Transistors. Measuring method of collector-base and emitterbase breakdown voltage
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CSN 35 8757 Cast.1-1985
Standard No.
CSN 35 8757 Cast.1-1985
Release Date
1985
Published By
CZ-CSN
Status
Withdraw
Latest
CSN 35 8757 Cast.1-1985
CSN 35 8757 Cast.1-1985 history
1985
CSN 35 8757 Cast.1-1985
Transistors. Measuring method of collector-base and emitterbase breakdown voltage
CSN 35 8757 Cast.1-1985 -All Parts
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CSN 35 8757 Cast.12-1989 Blpolar transistors. Impuls measuring method of break-down voltage collector-emltter
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CSN 35 8757 Cast.4-1985 Transistors. Methods of measuring collector cut-off current, emitter cut-off current and collector-emitter cut-off current
CSN 35 8757 Cast.5-1985 Transistors. Method of measuring collector and emitter barrier layer capacltance
CSN 35 8757 Cast.6-1985 Measuring method of static value of the common-emitter forward ourrent transfer ratio
CSN 35 8757 Cast.7-1985 Transistors. Measuring method of absolute value of forward current transfer ratio and transition frequency
CSN 35 8757 Cast.8-1985 Transistors. Measuring methods of base-emitor voltage
CSN 35 8757 Cast.9-1986 Transistors. Methods for measurement of thermal resistance
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