IEC 60749-17:2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Standard No.

IEC 60749-17:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2019-03

Replace By

IEC 60749-17:2019

Latest

IEC 60749-17:2019

Replace

IEC 47/1668/FDIS:2002

Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

IEC 60749-17:2003 history

• 2019 IEC 60749-17:2019 Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 17: Irradiation aux neutrons (Edition 2.0)
• 2003 IEC 60749-17:2003 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation