SAE J1752-1-2006
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

Standard No.

SAE J1752-1-2006

Release Date

2006

Published By

Society of Automotive Engineers (SAE)

Status

Be replaced 2016-05

Replace By

SAE J1752-1-2016

Latest

SAE J1752-1-2021

Scope

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J 1752 series of documents.

SAE J1752-1-2006 Referenced Document

• IEEE 100-2000 Dictionary of electrical and electronics terms*， 2024-04-18 Update
• SAE J1113/1-2006 Electromagnetic Compatibility Measurement Procedures and Limits for Components of Vehicles, Boats (up to 15 m), and Machines (Except Aircraft) (16.6 Hz to 18 GHz)*， 2006-10-13 Update
• SAE J1752/2-2003 Measurement of Radiated Emissions from Integrated Circuits -- Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
• SAE J1752/3-2003 Measurement of Radiated Emissions from Integrated CircuitsTEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

SAE J1752-1-2006 history

• 2021 SAE J1752-1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 2016 SAE J1752-1-2016 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 2006 SAE J1752-1-2006 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 1997 SAE J1752-1-1997 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions