IEC 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

Standard No.

IEC 60749-33:2005

Release Date

2005

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60749-33:2005

Replace

IEC 47/1737/FDIS:2003 IEC 60749-33:2004 IEC/PAS 62172:2000

Scope

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs cond

IEC 60749-33:2005 history

• 2005 IEC 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
• 2004 IEC 60749-33:2004 Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (Edition 1.0; Replaces IEC PAS 62172:2000)