IEC 60749-34:2005
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Standard No.

IEC 60749-34:2005

Release Date

2005

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2010-10

Replace By

IEC 60749-34:2010

Latest

IEC 60749-34:2010

Scope

Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward condu

IEC 60749-34:2005 history

• 2010 IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
• 2005 IEC 60749-34:2005 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
• 2004 IEC 60749-34:2004 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling