IEC PAS 62185:2000
Thermal shock test method

Standard No.
IEC PAS 62185:2000
Release Date
2000
Published By
International Electrotechnical Commission (IEC)
Status
Latest
IEC PAS 62185:2000
Replace By
IEC 60749-11:2002

IEC PAS 62185:2000 history

IEC PAS 62185:2000 Thermal shock test method was changed to IEC 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method.




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