ISO 12179:2000
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
- Standard No.
- ISO 12179:2000
- Release Date
- 2000
- Published By
- International Organization for Standardization (ISO)
- Status
- Replace By
- ISO 12179:2000/cor 1:2003
- Latest
- ISO 12179:2021
- Scope
- This International Standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards. Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
ISO 12179:2000 Referenced Document
- ISO 12085:1996 Geometrical Product Specification (GPS) - Surface texture: Profile method - Motif parameters
- ISO 3274:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
- ISO 4287:1997 Geometrical Product Specification (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters
ISO 12179:2000 history
- 2021 ISO 12179:2021 Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments
- 2003 ISO 12179:2000/cor 1:2003 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments; Technical Corrigendum 1
- 2000 ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
