Specifies test procedures used to apply simulated electrostatic discharge (ESD) stress to packaged optoelectronic components for the purpose of measuring the degree of vulnerability of these components to statice discharge that naturally occurs in the environment.
ANSI/TIA/EIA 455-129-1996 history
1996ANSI/TIA/EIA 455-129-1996 Procedure for Applying Human Body Model Electrostatic Discharge Stress to Packaged Optoelectronic Components