GB/T 1555-1997
Test methods for determining the orientation of a semiconductor single crystal (English Version)
- Standard No.
- GB/T 1555-1997
- Language
- Chinese, Available in English version
- Release Date
- 1997
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2010-06
- Replace By
- GB/T 1555-2009
- Latest
- GB/T 1555-2023
- Scope
- This standard specifies the methods for X-ray diffraction orientation and optical pattern orientation of semiconductor single crystals. This standard is applicable to the determination of the surface orientation of crystals of semiconductor single crystal materials approximately parallel to the low-index atomic planes. This standard includes two test methods: Method A X-ray diffraction orientation method. This method can be used for the orientation of all semiconductor single crystals. Method B Light Map Orientation Method. This method is currently used for the orientation of single-element semiconductor single crystals.
GB/T 1555-1997 history
- 2023 GB/T 1555-2023 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal
- 2009 GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
- 1997 GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
