GB/T 1553-1997
Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay (English Version)

Standard No.

GB/T 1553-1997

Language

Chinese, Available in English version

Release Date

1997

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Status

Be replaced 2010-06

Replace By

GB/T 1553-2009

Latest

GB/T 1553-2023

Scope

This standard specifies the measurement method for the minority carrier lifetime in silicon and germanium single crystals. This standard applies to the measurement of the lifetime of non-equilibrium minority carriers in the process of carrier recombination in extrinsic silicon and germanium single crystals.

GB/T 1553-1997 history

• 2023 GB/T 1553-2023 Determination of Minority Carrier Lifetime in Silicon and Germanium by Photoconductivity Decay Method
• 2009 GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
• 1997 GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay