GB/T 4937-1995
Mechanical and climatic test methods for semiconductor devices (English Version)
- Standard No.
- GB/T 4937-1995
- Language
- Chinese, Available in English version
- Release Date
- 1995
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2007-02
- Replace By
- GB/T 4937.1-2006
- GB/T 4937.2-2006
- Latest
- GB/T 4937.1-2006
- GB/T 4937.2-2006
- Scope
- This standard lists test methods applicable to semiconductor devices (discrete and integrated circuits). You can choose from them when you use them. For non-cavity devices, supplementary test methods may be required. Note: A non-cavity device is one in which the encapsulation material is in intimate contact with all exposed surfaces of the die without any voids in the device structure. This standard has considered IEC 68 "Basic Environmental Test Procedures" as much as possible.
GB/T 4937-1995 history
- 2006 GB/T 4937.1-2006 Semiconductor devices. Mechanical and climatic test methods. Part 1: General
- 1995 GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices
