IEC 60749-32:2002+AMD1:2010 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Standard No.

IEC 60749-32:2002+AMD1:2010 CSV

Release Date

2010

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60749-32:2002+AMD1:2010 CSV

IEC 60749-32:2002+AMD1:2010 CSV history

• 2010 IEC 60749-32:2002/AMD1:2010 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
• 2010 IEC 60749-32:2010 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
• 2003 IEC 60749-32:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
• 2002 IEC 60749-32:2002 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)