GB/T 35010.7-2018
Semiconductor die products—Part 7: XML schema for data exchange (English Version)
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GB/T 35010.7-2018
Standard No.
GB/T 35010.7-2018
Language
Chinese,
Available in English version
Release Date
2018
Published By
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
Latest
GB/T 35010.7-2018
GB/T 35010.7-2018 history
2018
GB/T 35010.7-2018
Semiconductor die products—Part 7: XML schema for data exchange
GB/T 35010.7-2018 -All Parts
GB/T 35010.1-2018 Semiconductor die products—Part 1:Requirements for procurement and use
GB/T 35010.2-2018 Semiconductor die products—Part 2: Exchange data formats
GB/T 35010.3-2018 Semiconductor die products—Part 3: Guide for handling, packing and storage
GB/T 35010.4-2018 Semiconductor die products—Part 4: Requirements for die users and suppliers
GB/T 35010.5-2018 Semiconductor die products—Part 5:Requirements for concerning electrical simulation
GB/T 35010.6-2018 Semiconductor die products—Part 6: Requirements for concerning thermal simulation
GB/T 35010.7-2018 Semiconductor die products—Part 7: XML schema for data exchange
GB/T 35010.8-2018 Semiconductor die products—Part8: EXPRESS model schema for data exchange
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