GB/T 38532-2020 (English Version) PDF

Standard No.: GB/T 38532-2020
Language: Chinese, Available in English version
Release Date: 2020
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 38532-2020

Scope: This standard specifies the method for the determination of the average grain size of polished cross-sections by electron backscatter diffraction (EBSD), including the measurement requirements for orientation, misorientation and pattern quality factor related to the position in the crystal sample [1]. Note 1: The use of optical microscopy to determine the grain size has been generally accepted. Compared with it, EBSD has many technical advantages, such as high spatial resolution and quantitative description of grain orientation. Note 2: This method can also be used for grain size measurement of some complex materials (such as dual-phase materials). Note 3: When analyzing samples with a large degree of deformation, the results need to be handled with caution.

GB/T 38532-2020 Referenced Document

ISO 16700 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 21748 Guidance for the use of repeatability, reproducibility and trueness estimates in measurement uncertainty evaluation
ISO 24173 Microbeam analysis*， 2024-01-01 Update

2020 GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size

$Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size$