IEC 60749-30:2020
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- Standard No.
- IEC 60749-30:2020
- Release Date
- 2020
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 60749-30:2020
IEC 60749-30:2020 history
- 0000 IEC 60749-30:2020 RLV
- 2011 IEC 60749-30:2005/AMD1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- 2011 IEC 60749-30:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- 2005 IEC 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
