IEC 60749-29:2003
Dispositifs à semiconducteurs Méthodes d?essais mécaniques et climatiques Partie 29: Essai de verrouillage (Edition 1.0; Replaces IEC PAS 62181)

Standard No.

IEC 60749-29:2003

Release Date

2003

Published By

IEC - International Electrotechnical Commission

Status

Be replaced 2011-04

Replace By

IEC 60749-29:2011

Latest

IEC 60749-29:2011

Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics

IEC 60749-29:2003 history

• 2011 IEC 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
• 2003 IEC 60749-29:2003 Dispositifs à semiconducteurs Méthodes d?essais mécaniques et climatiques Partie 29: Essai de verrouillage (Edition 1.0; Replaces IEC PAS 62181)