UNE-EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

Standard No.

UNE-EN 60749-23:2005/A1:2011

Release Date

2011

Published By

AENOR

Latest

UNE-EN 60749-23:2005/A1:2011

UNE-EN 60749-23:2005/A1:2011 history

• 2011 UNE-EN 60749-23:2005/A1:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
• 2005 UNE-EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life